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International Conference on

Semiconductors, Optoelectronics and Nanostructures

THEME: "Advancing Semiconductor Science for a Smarter Future"

img2 29-30 Mar 2027
img2 Berlin, Germany

Semiconductor Metrology and Advanced Characterization Techniques

This session highlights advanced experimental methods used to study semiconductor materials and devices, including electron microscopy, X-ray diffraction, scanning probe techniques, and ultrafast spectroscopy for structural and electronic analysis.

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